ASIS&T SIG/MET Workshop (Seattle) - Call for Abstracts

Larivière Vincent vincent.lariviere at UMONTREAL.CA
Wed Jul 16 15:03:57 EDT 2014



The ASIS&T Special Interest Group for Metrics (SIG/MET) will host a workshop on Wednesday, November 5th 2014 (9am - 5pm), at the end of the ASIS&T Annual Meeting in Seattle, Washington. This workshop will provide an opportunity for presentations and in-depth conversations on metric-related issues, including the latest theories, approaches, applications, innovations, and tools. The workshop is envisioned as a combination of short presentations and open discussion.

Research on metrics has been growing significantly over the last decades. In addition to account for a significant proportion of the literature published in core LIS journals, there is also a large proportion of metrics literature published in general science journal as well as in medical journals. Recent workshops on the topics have been largely successful. For instance, on November 2nd 2013, SIG/MET held its third annual Workshop on Informetric and Scientometric Research, during the ASIS&T Annual Meeting in Montreal, Quebec, Canada. The full day event, sponsored by both Elsevier and Thomson Reuters, attracted 30 participants. The symposium consisted of two poster presentations and thirteen paper presentations by authors from nine countries (Canada, Finland, Germany, Israel, Japan, South Korea, Sweden, United Kingdom and United States). As in previous years, the SIG recognized outstanding student contributions, with one session devoted to presenting these awards and presentations by the recipients.

The 2014 workshop would continue in this vein and consolidate the work done in previous iterations of the workshop. We propose to include presentations from both established researchers and students, all done in an informal setting where genuine exchanges can be made. The topics covered would include the following but are not limited to:

- New indicators and methods

- Applications of indicators

- Theories of the publication process and citations

- Metrics in a library setting

- Open access and metrics

- Tool development

- Limitations, misuses and adverse effects of metrics

- Measurements and implications of interdisciplinarity

- Visualizations of scholarly impact measures and analyses

SIG/MET is the Special Interest Group for the measurement of information production and use. It encourages the development and networking of all those interested in the measurement of information. It encompasses not only bibliometrics, scientometrics, webometrics and informetrics, but also measurement of the Web and the Internet, applications running on these platforms, and metrics related to network analysis, visualization, and scholarly communication.


Submissions should be in the form of a two-page structured abstract. Conceptual, empirical, and works-in-progress will be accepted for submission. Where appropriate, up to three figures/tables can be provided.  Two types of submissions will be accepted: posters and presentations. Please indicate the type of submission in bold at the beginning of your submission. The requirements for both formats are the same.

Submit in .pdf, .doc or .docx to :

Peer-Review process

Each submission will be reviewed and brief feedback will be given in narrative format.

Important Dates
Submissions due: August 31, 2014
Notifications: September 15, 2014
Workshop: November 5, 2014

Registration fees
The registration fee is $200 for ASIST members and will include wifi and two break meals. First 15 students who register will receive $100 back from their registration, courtesy of Elsevier.

With questions, please contact
Vincent Larivière
Chair, SIG/MET
vincent.lariviere at

Vincent Larivière, Ph.D.
Chaire de recherche du Canada sur les transformations de la communication savante
École de bibliothéconomie et des sciences de l'information (EBSI)
Université de Montréal

Directeur scientifique adjoint
Observatoire des sciences et des technologies (OST)
Centre interuniversitaire de recherche sur la science et la technologie (CIRST)
Université du Québec à Montréal

Tél: +1.514.343.5600
Fax: +1.514.343.5753
vincent.lariviere at<mailto:vincent.lariviere at>

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