CALL FOR PAPERS - SECOND SPECIAL ISSUE IPM ON INFORMETRICS

[Leo Egghe]

SECOND SPECIAL ISSUE OF INFORMATION PROCESSING AND MANAGEMENT ON
INFORMETRICS



CALL FOR PAPERS



OCTOBER 24, 2005



The journal Information Processing and Management (IPM) will publish, mid
2006, a second special issue on the general topic "informetrics". Issue
guest editor is Leo Egghe of the Limburgs Universitair Centrum in Belgium.
Note that from June 15, 2005 on the name of LUC is changed into
"Universiteit Hasselt" (UHasselt) (see coordinates below). There is no
restriction on informetric topics, for reasons explained in the second part
of this call but one seeks papers of high quality on either one or both of
the following aspects:



*            professional data gathering

*            explanation of regularities found in the data (mathematical
modelling).



As such we expect informetric papers on the following possible topics:



*           bibliographies (authors, journals)

*           indexing and information retrieval

*           libraries and other information centres

*           citation analysis and performance indicators

*           growth and aging (obsolescence) of literature

*           scientific communication (incl. collaboration), social networks
among which the Internet, incl. webometrics

*           links (topical as well as methodological) with other -metrics
fields such as sociometrics, econometrics, biometrics, quantitative
linguistics and the study of complex, self-organising systems.



The deadline for submission is October 31, 2005.



The papers should be sent to



Prof. Dr. Leo Egghe

Issue guest editor IPM



Universiteit Hasselt

Agoralaan - Gebouw D

B-3590 Diepenbeek

Belgium

tel.: +32 11 26.81.21

fax: +32 11 26.81.26

e-mail: leo.egghe at uhasselt.be



Papers should be sent, preferably, by e-mail. If sent by airmail we expect
that 3 copies are submitted.

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It is intended that this should be the second of a growing series of issues
on this theme that will become the core collection of work in this field.
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