Bhattacharya, S, Impact of Indian patents: Assessment through citation analysis Editor(s): TorresSalinas, D; Moed, HF, Source: PROCEEDINGS OF ISSI 2007: 11TH INTERNATIONAL CONFERENCE OF THE ISSI, VOLS I AND II 95-99, 2007
    Eugene Garfield 
    garfield at CODEX.CIS.UPENN.EDU
       
    Wed Dec 19 11:06:39 EST 2007
    
    
  
Email: Sujit_academic at yahoo.com
Author(s): Bhattacharya, S (Bhattacharya, Sujit)
 
Title: Impact of Indian patents: Assessment through citation analysis 
Editor(s): TorresSalinas, D; Moed, HF 
Source: PROCEEDINGS OF ISSI 2007: 11TH INTERNATIONAL CONFERENCE OF THE 
INTERNATIONAL SOCIETY FOR SCIENTOMETRICS AND INFORMETRICS, VOLS I AND II 
95-99, 2007 
Cited Reference Count: 16 
Language: English 
Document Type: Article 
Conference Title: 11th International Conference of the International-
Society-for-Scientrometrics-and-Informetrics 
Conference Date: JUN 25-27, 2007 
Conference Location: Madrid, SPAIN 
Conference Sponsors: Int Soc Scientrometr & Informetr, CSIC, Minist Educ & 
Ciencia, FECYT, Comunidad Madrid, Eugene Garfield Fdn, Thomson Sci, 
Elsevier, Journal Informetr, Scopus, Ayuntamiento Madrid, Sci Metrix, Univ 
Carlos III Madrid 
Author Keywords: citation analysis; forward citation; impact assessment 
KeyWords Plus: RIGHTS 
Abstract: The present study examined the impact of patents granted to 
Indian organisations by the USPTO during the period 1990-2002. The impact 
analysis was based on the patents cited by other patents and journal 
articles. The citing and cited data was disaggregated at different levels 
to bring out the various characteristics. The impact of patents 
of 'prolific' patenting organisation, impact of patents in different 
sectors/sub-sectors, highly cited patents, scientific fields/sub-fields 
that were citing Indian patents, and organisations that were noticing 
these patents, ete were uncovered. The importance of this exercise for 
policy and strategic purpose are discussed.
 
Addresses: Natl Inst Sci Technol & Dev Studies, New Delhi, 110012 India. 
Publisher Name: INT SOC SCIENTOMETRICS & INFORMETRICS-ISSI 
Publisher Address: KATHOLIEKE UNIV LEUVEN, FACULTEIT E T E W, DEKENSTRAAT 
2, LEUVEN, B-3000, BELGIUM 
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