Tijssen RJW "Scoreboards of research excellence" Research Evaluation 12(2) p.91-103 Aug 2003

[Eugene Garfield]

RJW Tijssen : tijssen at cwts.leidenuniv.nl


TITLE   Scoreboards of research excellence
AUTHOR  Tijssen RJW
JOURNAL RESEARCH EVALUATION 12 (2): 91-103 AUG 2003

Document type: Article     Language: English     Cited References: 21
Times Cited: 0      Explanation

Abstract:
A critical discussion is presented of what could be understood as research
excellence, and how to deal with fundamental issues and methodological
challenges in operationalizing and evaluating this complex, multi-faceted
notion in terms of measurable attributes at organizational levels. This
paper argues for a systemic and interactive approach, combining multiple
perspectives and stakeholders, while incorporating a wide range of
information sources and quantitative indicators within the analytical
framework of a 'scoreboard'. Context-specific and customized scoreboards
show promise as a structuring tool in informed debate, indicator selection,
comparative analysis and benchmarking studies of research excellence.
Guidelines and recommendations are illustrated by way of a fictitious
scoreboard with recent empirical data for economics research at the
universities in the Netherlands.

Addresses:
Tijssen RJW, Leiden Univ, Ctr Sci & Technol Studies, CWTS, NL-2300 RA
Leiden, Netherlands
Leiden Univ, Ctr Sci & Technol Studies, CWTS, NL-2300 RA Leiden, Netherlands

Publisher:
BEECH TREE PUBLISHING, 10 WATFORD CLOSE,, GUILDFORD GU1 2EP, SURREY, ENGLAND

IDS Number:
736UW

ISSN:
0958-2029

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 *EUR COMM             MAP EXC RES TECHN DE                   434      2001
 *EUR COMM             STRATA ETAN EXP GROU                            2002
 *HIGH ED RES OPP U    RAE 2001 RES                                    2002
 *RAE                  200 RAE                                         2000
 *ROYAL AC ENG         MEAS EXC ENG RES                                2000
 *VSNU                 EC ASS RES QUAL                                 2002
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 GEISLER E             METRICS SCI TECHNOLO                            2000
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 VANRAAN AFJ           SCIENTOMETRICS                36       397      1996