ABS:Gupta, Tech trends & patent analysis

[Gretchen Whitney]

PT J
AU Gupta, VK
TI Technological trends in the area of fullerenes using
   bibliometric analysis of patents
SO SCIENTOMETRICS
LA English
C1 Natl Inst Sci Technol & Dev Studies, Dr KS Krishnan Marg, New
   Delhi 110012, India.
   Natl Inst Sci Technol & Dev Studies, New Delhi 110012, India.
AB Patents are a useful source of scientific and technological
   information. The bibliometrics analysis of patents has been
   made to identify technological trends in the area of fullerenes
   and study other parameters like growth of the patenting
   activity, active players in the field from industry, academia
   and government research institutions. It indicates that firms
   and R&D organisations in developing countries could undertake
   similar study on specific topics of their interests and obtain
   relevant insights.
BP 17
EP 31
PG 15
JI Scientometrics
PY 1999
PD JAN
VL 44
IS 1
GA 160PZ
RP Gupta VK
J9 SCIENTOMETRICS
ER

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Gretchen Whitney, PhD                                     tel 423.974.7919
School of Information Sciences                            fax 423.974.4967
University of Tennessee, Knoxville TN 37996 USA           gwhitney at utk.edu
http://web.utk.edu/~gwhitney/
jESSE:http://web.utk.edu/~gwhitney/jesse.html
SIGMETRICS:http://web.utk.edu/~gwhitney/sigmetrics.html
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