Small, H (Small, Henry); Upham, P (Upham, Phineas) Citation structure of an emerging research area: Organic thin film transistors

[Eugene Garfield]

Email address: henry.small at thomson.com

Author(s): Small, H (Small, Henry); Upham, P (Upham, Phineas) 

Title: Citation structure of an emerging research area: Organic thin film 
transistors 

Editor(s): TorresSalinas, D; Moed, HF 

Source: PROCEEDINGS OF ISSI 2007: 11TH INTERNATIONAL CONFERENCE OF THE 
INTERNATIONAL SOCIETY FOR SCIENTOMETRICS AND INFORMETRICS, VOLS I AND II 
718-725, 2007 

Language: English 
Document Type: Article 

Conference Title: 11th International Conference of the International-
Society-for-Scientrometrics-and-Informetrics
 
Conference Date: JUN 25-27, 2007 

Conference Location: Madrid, SPAIN 

Conference Sponsors: Int Soc Scientrometr & Informetr, CSIC, Minist Educ & 
Ciencia, FECYT, Comunidad Madrid, Eugene Garfield Fdn, Thomson Sci, 
Elsevier, Journal Informetr, Scopus, Ayuntamiento Madrid, Sci Metrix, Univ 
Carlos III Madrid 

Author Keywords: citation analysis; specialties; co-citation clustering; 
emerging areas; mapping 

KeyWords Plus: SPECIALTY; SCIENCE 

Abstract: A case study of an emerging research area is presented dealing 
with the creation of organic thin film transistors, a subtopic within the 
general area called "plastic electronics." The purpose of this case study 
is to determine the structural properties of the citation network that may 
be characteristic of the emergence, early development and demise of a 
research area. Research on organic thin film transistors is highly 
interdisciplinary, involving journals and research groups from physics, 
chemistry, materials science, and engineering. There is a clear path to 
industrial applications if certain technical problems can be overcome. 
Despite the applied nature and potential for patentable inventions, 
scholarly publications from both academia and industry have continued at a 
rapid pace through 2006. The question is whether the bibliometric 
indicators point to a decline in this area due to imminent 
commercialization or to insurmountable technical problems with these 
materials. 

Addresses: Thomson Sci, Philadelphia, PA 19104 USA. 

Publisher Name: INT SOC SCIENTOMETRICS & INFORMETRICS-ISSI 
Publisher Address: KATHOLIEKE UNIV LEUVEN, FACULTEIT E T E W, DEKENSTRAAT 
2, LEUVEN, B-3000, BELGIUM 

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