Kuo, W (Kuo, Way); Rupe, J (Rupe, Jason) R-impact: Reliability-based citation impact factor IEEE TRANSACTIONS ON RELIABILITY, 56 (3): 366-367 SEP 2007

[Eugene Garfield]

Author(s): Kuo, W (Kuo, Way); Rupe, J (Rupe, Jason) 

Title: R-impact: Reliability-based citation impact factor 

Source: IEEE TRANSACTIONS ON RELIABILITY, 56 (3): 366-367 SEP 2007 

Email Address: way at utk.edu

Language: English 

Document Type: Editorial Material 

Cited Reference Count: 4 

Times Cited: 1 

Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC 

Publisher Address: 445 HOES LANE, PISCATAWAY, NJ 08855 USA 

ISSN: 0018-9529 

29-char Source Abbrev.: IEEE TRANS REL 

ISO Source Abbrev.: IEEE Trans. Reliab.
 
Source Item Page Count: 2 

Subject Category: Computer Science, Hardware & Architecture; Computer 
Science, Software Engineering; Engineering, Electrical & Electronic
 
ISI Document Delivery No.: 208HE 

DEURENBERG R
JOURNAL DESELECTION IN A MEDICAL UNIVERSITY-LIBRARY BY RANKING PERIODICALS 
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GARFIELD E
CURRENT CONTENTS : 1994 

PLOMP R
THE HIGHLY CITED PAPERS OF PROFESSORS AS AN INDICATOR OF A RESEARCH GROUPS 
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