Behrens H "A bibliometric study in crystallography " ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE 62: 993-1001 Part 6, DEC 2006

Eugene Garfield garfield at CODEX.CIS.UPENN.EDU
Wed May 9 00:32:41 EDT 2007


E-mail Addresses: peter.luksch at fiz-karlsruhe.de 


Title: A bibliometric study in crystallography 

Author(s): Behrens H (Behrens, Heinrich), Luksch P (Luksch, Peter) 

Source: ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE 62: 993-1001 
Part 6, DEC 2006 

Document Type: Article 
Language: English 
Cited References: 17      Times Cited: 0    
   
Abstract: 
This is an application of the mathematical and statistical techniques of 
bibliometrics to the field of crystallography. This study is, however, 
restricted to inorganic compounds. The data were taken from the Inorganic 
Crystal Structure Database, which is a well defined and evaluated body of 
literature and data published from 1913 to date. The data were loaded in a 
relational database system, which allows a widespread analysis. The 
following results were obtained: The cumulative growth rate of the number 
of experimentally determined crystal structures is best described by a 
third-degree polynomial function. Except for the upper end of the curve, 
Bradford's plot can be described well by the analytical Leimkuhler 
function. The publication process is dominated by a small number of 
periodicals. The probability of the author productivity in terms of 
publications follows an inverse power law of the Lotka form and in terms 
of database entries an inverse power law in the Mandelbrot form. In both 
cases the exponent is about 1.7. For the lower tail of the data an 
exponential correction factor has to be applied. Multiple authorship has 
increased from 1.4 authors per publication to about four within the past 
eight decades. The author distribution itself is represented by a 
lognormal distribution. 


Addresses: Luksch P (reprint author), FIZ Karlsruhe, D-76344 Eggenstein 
Leopoldshafen, Germany
FIZ Karlsruhe, D-76344 Eggenstein Leopoldshafen, Germany

E-mail Addresses: peter.luksch at fiz-karlsruhe.de 

Publisher: BLACKWELL PUBLISHING, 9600 GARSINGTON RD, OXFORD OX4 2DQ, OXON, 
ENGLAND 
Subject Category: Crystallography 
IDS Number: 104WW 
ISSN: 0108-7681 


CITED REFERENCES :
BAILONMORENO R
Bibliometric laws: Empirical flaws of fit
SCIENTOMETRICS 63 : 209 2005   
 BEHRENS H
BER WISSENSCHAFTSGES 29 : 89 2006   
 BEHRENS H
Data import and validation in the inorganic Crystal Structure Database
JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY 
101 : 365 1996   
 BELSKY A
New developments in the Inorganic Crystal Structure Database (ICSD): 
accessibility in support of materials research and design
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE 58 : 364 2002   
 BENNION BC
ESTIMATING SIZE AND SCATTER OF WORLD PHYSICS JOURNAL LITERATURE
CZECHOSLOVAK JOURNAL OF PHYSICS 36 : 19 1986   
 BERGERHOFF G
CRYSTALLOGRAPHIC DAT : 77 1987   
 BOOKSTEIN A
INFORMETRIC DISTRIBUTIONS .1. UNIFIED OVERVIEW
JOURNAL OF THE AMERICAN SOCIETY FOR INFORMATION SCIENCE 41 : 368 1990   
 BRADFORD SC
ENGINEERING-LONDON 137 : 85 1934   
 DIODATO V
DICT BIBLIOMETRICS : 1994   
 FLUCK E
Inorganic crystal structure database (ICSD) and standardized data and 
crystal chemical characterization of inorganic structure types (TYPIX) - 
Two tools for inorganic chemists and crystallographers
JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY 
101 : 217 1996   
 HAWKINS DT
CRYSTALLOGRAPHIC LITERATURE - A BIBLIOMETRIC AND CITATION ANALYSIS
ACTA CRYSTALLOGRAPHICA SECTION A 36 : 475 1980   
 LEIMKUHLER FF
BRADFORD DISTRIBUTION
JOURNAL OF DOCUMENTATION 23 : 197 1967   
 LOTKA AJ
J WASHINGTON ACADEMY 16 : 317 1926   
 MANDELBROT B
FRACTAL GEOMETRY NAT : 1982   
 PERLINE R
Strong, weak and false inverse power laws
STATISTICAL SCIENCE 20 : 68 2005   
 REDMAN J
A citation analysis of the Cambridge Crystallographic Data Centre
JOURNAL OF APPLIED CRYSTALLOGRAPHY 34 : 375 2001   
 SOLLAPRICE DJ
LITTLE SCI BIG SCI : 1963  



More information about the SIGMETRICS mailing list